MODEL : MLP100
The MLP100 High resolution LIV measurement system is a multi-purpose equipment designed for probing, visual and spectral analysis of micron size sample. Built-in Dual side microscope sytem is equiped with long working distance objective lens providing greater performance in the flip and vertical chip analysis.
Dual side microscope system
Top and bottom microscopes have long working distance objectives.
Long WD 2X,5X,10X,20X,50X and 100X
Dual side Vison system
5M pixel vision cameras and vison software
Dual side spectrometer and spectrum focusing module
Easy to analysis spectrum of weak signal on the sample.
6” quartz plate can get image the bottom of micron sample .
X-Y travel stage: coarse focus knob and fine focus knob.
X-Y-Z travel Manipulator with magnetic base
Flip and Vertical chip analysis
Image capture, save, motion picture, image fusion measurement at both of live and captured image Scale Bar on the image
Spectrum analysys and Wp(peak wavelength), Wd(dominant wavelength),PD Intensity Integrated and Peak intensity, FWHM, I-V(current-voltage) curve, I-sweep or V—sweep L-I-V